Items where Author is "Osais, Yahya E."
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ArticleEl-Maleh, Aiman H. and Osais, Yahya E. (2004) A Class-based Clustering Static Compaction Technique for Combinational Circuits. 16th International Conference on Microelectronics. pp. 522-525. El-Maleh, Aiman H. and Osais, Yahya E. (2004) On Test Vector Reordering for Combinational Circuits. 16th International Conference on Microelectronics. 772 -775. Osais, Yahya E. and El-Maleh, Aiman H. (2003) A STATIC TEST COMPACTION TECHNIQUE FOR COMBINATIONAL CIRCUITS BASED ON INDEPENDENT FAULT CLUSTERING. 10th IEEE International Conference on Electronics, Circuits and Systems. pp. 1316-1319. El-Maleh, Aiman H. and Osais, Yahya E. (2003) Test Vector Decomposition Based Static Compaction Algorithms for Combinational Circuits. ACM Transactions on Design Automation of Electronic Systems, 8 (4). pp. 430-459. El-Maleh, Aiman H. and Osais, Yahya E. (2001) A Retiming-Based Test Pattern Generator Design for Built-In Self Test of Data Path Architectures. Int. Symp. on Circuits and Systems. pp. 550-553. |
