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Items where Author is "Osais, Yahya E."

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Number of items: 5.

Article

El-Maleh, Aiman H. and Osais, Yahya E. (2004) A Class-based Clustering Static Compaction Technique for Combinational Circuits. 16th International Conference on Microelectronics. pp. 522-525.

El-Maleh, Aiman H. and Osais, Yahya E. (2004) On Test Vector Reordering for Combinational Circuits. 16th International Conference on Microelectronics. 772 -775.

Osais, Yahya E. and El-Maleh, Aiman H. (2003) A STATIC TEST COMPACTION TECHNIQUE FOR COMBINATIONAL CIRCUITS BASED ON INDEPENDENT FAULT CLUSTERING. 10th IEEE International Conference on Electronics, Circuits and Systems. pp. 1316-1319.

El-Maleh, Aiman H. and Osais, Yahya E. (2003) Test Vector Decomposition Based Static Compaction Algorithms for Combinational Circuits. ACM Transactions on Design Automation of Electronic Systems, 8 (4). pp. 430-459.

El-Maleh, Aiman H. and Osais, Yahya E. (2001) A Retiming-Based Test Pattern Generator Design for Built-In Self Test of Data Path Architectures. Int. Symp. on Circuits and Systems. pp. 550-553.

This list was generated on Mon Jul 28 09:16:07 2014 AST.