A Class-based Clustering Static Compaction Technique for Combinational Circuits

(2004) A Class-based Clustering Static Compaction Technique for Combinational Circuits. 16th International Conference on Microelectronics. pp. 522-525.

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Abstract

Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.

Item Type: Article
Subjects: Computer
Department: College of Computing and Mathematics > Information and Computer Science
Depositing User: AIMAN HELMI EL-MALEH
Date Deposited: 26 Feb 2008 12:38
Last Modified: 01 Nov 2019 13:22
URI: https://eprints.kfupm.edu.sa/id/eprint/132