Items where Author is "Chmelar, E."

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 1.

Article

(0000) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.

This list was generated on Thu May 30 21:15:24 2024 +03.