Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration

(0000) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.


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This paper presents segmented addressable scan (SAS), a test architecture that addresses test data volume, test application time, test power consumption, and tester channel requirements using a hardware overhead of a few gates per scan chain. Using SAS, this paper also presents systematic scan reconfiguration, a test data compression algorithm that is applied to achieve 10times to 40 times compression ratios without requiring any information from the automatic-test-pattern-generation tool about the unspecified bits. The architecture and the algorithm were applied to both single stuck as well as transition fault test sets

Item Type: Article
Subjects: Computer
Department: College of Engineering and Physics > Electrical Engineering
Depositing User: Mr. Admin Admin
Date Deposited: 24 Jun 2008 13:31
Last Modified: 01 Nov 2019 14:05