Items where Author is "Al-Suwaiyan, A."
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Number of items: 2.
Article
(2002) An efficient test relaxation technique for combinational circuits based on critical path tracing. Electronics, Circuits and Systems, 2002. 9th International conference, 2.
(2002) An efficient test relaxation technique for combinational & full-scan sequential circuits. VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE, 1.