Items where Author is "Al-Suwaiyan, A."

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(2002) An efficient test relaxation technique for combinational circuits based on critical path tracing. Electronics, Circuits and Systems, 2002. 9th International conference, 2.

(2002) An efficient test relaxation technique for combinational & full-scan sequential circuits. VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE, 1.

This list was generated on Fri Sep 25 22:15:35 2020 +03.