Items where Author is "Al-Suwaiyan, A."
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Number of items: 2.
(2002) An efficient test relaxation technique for combinational circuits based on critical path tracing. Electronics, Circuits and Systems, 2002. 9th International conference, 2.
(2002) An efficient test relaxation technique for combinational & full-scan sequential circuits. VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE, 1.