Items where Author is "Gunda, A."
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Number of items: 2.
(0000) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.
(2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.