Items where Author is "Gunda, A."

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(0000) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.

(2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.

This list was generated on Fri Sep 18 13:02:06 2020 +03.