Items where Author is "Amin, A.A."

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(1997) New fault models and efficient BIST algorithms for dual-portmemories. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 16.

(1996) Generic DFT approach for pattern sensitive faults in word-orientedmemories. Computers and Digital Techniques, IEE Proceedings -, 143.

Efficient O(n) BIST algorithms for DDNPS faults in dual portmemories. Test Conference, 1994. Proceedings., International, 1.

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