Items where Author is "Al-Suwaiyan, Ali"
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Number of items: 3.
AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS. The 6th Saudi Engineering Conference, KFUPM, Dhahran, December 2002.
(2002) An Efficient Test Relaxation Technique for Combinational Circuits Based on Critical Path Tracing. 9th IEEE International Conference on Electronics, Circuits and Systems. pp. 461-465.
(2002) An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits. 20’th IEEE VLSI Test Symposium. pp. 53-59.