Items where Author is "Abdel-Aal, R.E."
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(2008) Spam Filtering with Abductive Networks. In: the IEEE International Joint Conference on Neural Networks (IJCNN’08).
(2008) Constructing optimal educational tests using GMDH-based item ranking and selection. NEUROCOMPUTING. (In Press)
(2008) Construction and analysis of educational tests using abductive machine learning. COMPUTERS & EDUCATION, 51 (1). pp. 1-16.
(1997) New fault models and efficient BIST algorithms for dual-portmemories. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 16.
(1989) Enhancement of two-dimensional holographic images by resolutionimprovement through hologram aperture expansion. Image Processing and its Applications, 1989., Third International conference, 1.
(1989) The VAX 11/785 cluster-based data acquisition system at the KFUPMenergy research laboratory. Nuclear Science, IEEE Transactions on, 36.
(1990) Expansion of two-dimensional imaging apertures for resolutionimprovement in long-wavelength holography. Communications, Speech and Vision, IEE Proceedings I [see also IEE Proceedings-Communications], 137.
(1996) Generic DFT approach for pattern sensitive faults in word-orientedmemories. Computers and Digital Techniques, IEE Proceedings -, 143.
(1998) Automatic fitting of Gaussian peaks using abductive machine learning. Nuclear Science, IEEE Transactions on, 45.
(2004) Short-term hourly load forecasting using abductive networks. Power Systems, IEEE Transactions on, 19.
(1989) CAMAC/MBD interface for the VAX data acquisition facility at theKFUPM Energy Research Laboratory. Nuclear Science, IEEE Transactions on, 36.
Efficient O(n) BIST algorithms for DDNPS faults in dual portmemories. Test Conference, 1994. Proceedings., International, 1.
(1989) Performance of the VAX 11/785 data acquisition system at the KFUPMEnergy Research Laboratory. Nuclear Science, IEEE Transactions on, 36.
(1996) A Generic DFT Approach for Pattern Sensitive Faults in Word-Oriented Memories. IEE Proceedings E on Computers and Digital Techniques, 143 (3). pp. 199-202.
(1997) New Fault Models and Efficient BIST Algorithm for Dual Port Memories. IEEE Transations on CAD of Integrated Circuits and Systems, 16 (9). pp. 987-1000.