(2004) A Class-based Clustering Static Compaction Technique for Combinational Circuits. 16th International Conference on Microelectronics. pp. 522-525.
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Abstract
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.
| Item Type: | Article |
|---|---|
| Subjects: | Computer |
| Department: | College of Computing and Mathematics > Information and Computer Science |
| Depositing User: | AIMAN HELMI EL-MALEH |
| Date Deposited: | 26 Feb 2008 12:38 |
| Last Modified: | 01 Nov 2019 13:22 |
| URI: | http://eprints.kfupm.edu.sa/id/eprint/132 |