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Items where Author is "Osais, Y.E."

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Article

El-Maleh, A.H. and Osais, Y.E. (2004) On test vector reordering for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.

El-Maleh, A.H. and Osais, Y.E. (2004) A class-based clustering static compaction technique for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.

Osais, Y.E. and El-Maleh, A.H. (2003) A static test compaction technique for combinational circuits based on independent fault clustering. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 3.

This list was generated on Fri Apr 18 09:32:43 2014 AST.