Items where Author is "Osais, Y.E."
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ArticleEl-Maleh, A.H. and Osais, Y.E. (2004) On test vector reordering for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1. El-Maleh, A.H. and Osais, Y.E. (2004) A class-based clustering static compaction technique for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1. Osais, Y.E. and El-Maleh, A.H. (2003) A static test compaction technique for combinational circuits based on independent fault clustering. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 3. |
