El-Maleh, Aiman and Al-Suwaiyan, Ali AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS. The 6th Saudi Engineering Conference, KFUPM, Dhahran, December 2002.
This is the latest version of this item.
![[img]](http://eprints.kfupm.edu.sa/style/images/fileicons/application_pdf.png) | PDF 248Kb |
Abstract
Reducing test data size is one of the major challenges in testing systems-on-a-chip. This can be achieved by test compaction and/or compression techniques. Having a partially specified or relaxed test set increases the effectiveness of compaction and compression techniques. In this paper, we propose a novel and efficient test relaxation technique for combinational circuits. It is based on critical path tracing and hence it may result in a reduction in the fault coverage. However, based on experimental results on ISCAS benchmark circuits, the drop in the fault coverage (if any) after relaxation is small for most of the circuits. The technique is faster than the brute-force test relaxation method by several orders of magnitude.
| Item Type: | Article |
|---|---|
| Subjects: | Computer |
| Divisions: | College Of Computer Sciences and Engineering > Information and Computer Science Dept |
| Creators: | El-Maleh, Aiman and Al-Suwaiyan, Ali |
| Email: | aimane@ccse.kfupm.edu.sa, UNSPECIFIED |
| ID Code: | 1644 |
| Deposited By: | INVALID USER |
| Deposited On: | 02 Jun 2008 14:12 |
| Last Modified: | 12 Apr 2011 13:11 |
Available Versions of this Item
- AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS. (deposited 02 Jun 2008 14:12) [Currently Displayed]
Repository Staff Only: item control page