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A Class-based Clustering Static Compaction Technique for Combinational Circuits

El-Maleh, Aiman H. and Osais, Yahya E. (2004) A Class-based Clustering Static Compaction Technique for Combinational Circuits. 16th International Conference on Microelectronics. pp. 522-525.

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Abstract

Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.



Item Type:Article
Date:06 December 2004
Date Type:Publication
Subjects:Computer
Divisions:College Of Computer Sciences and Engineering > Information and Computer Science Dept
Creators:El-Maleh, Aiman H. and Osais, Yahya E.
Email:aimane@kfupm.edu.sa, yosais@kfupm.edu.sa
ID Code:132
Deposited By:AIMAN HELMI EL-MALEH
Deposited On:26 Feb 2008 15:38
Last Modified:12 Apr 2011 13:06

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