El-Maleh, Aiman H. and Osais, Yahya E. (2004) A Class-based Clustering Static Compaction Technique for Combinational Circuits. 16th International Conference on Microelectronics. pp. 522-525.
|PDF (A Class-based Clustering Static Compaction Technique for Combinational Circuits)|
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.
|Date:||06 December 2004|
|Divisions:||College Of Computer Sciences and Engineering > Information and Computer Science Dept|
|Creators:||El-Maleh, Aiman H. and Osais, Yahya E.|
|Deposited By:||AIMAN HELMI EL-MALEH|
|Deposited On:||26 Feb 2008 15:38|
|Last Modified:||12 Apr 2011 13:06|
Repository Staff Only: item control page