Items where Author is "Osman, M.Y."
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Article
(1997) New fault models and efficient BIST algorithms for dual-portmemories. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 16.
Efficient O(n) BIST algorithms for DDNPS faults in dual portmemories. Test Conference, 1994. Proceedings., International, 1.