Items where Author is "Osais, Y.E."
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Number of items: 3.
(2004) A class-based clustering static compaction technique for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.
(2004) On test vector reordering for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.
(2003) A static test compaction technique for combinational circuits based on independent fault clustering. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 3.