Items where Author is "Al Zahir, Saif"
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(2001) An Efficient Test Vector Compression Technique Based on Geometric Shapes. 8th IEEE International Conference on Electronics, Circuits and Systems. pp. 1561-1564.
(2001) A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip. 19’th IEEE VLSI Test Symposium (VTS). pp. 54-59.