Items where Author is "Al-Utaibi, K."
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Number of items: 2.
(2003) On efficient extraction of partially specified test sets for synchronous sequential circuits. Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on, 5.
(2003) An efficient test relaxation technique for synchronous sequential circuits. VLSI Test Symposium, 2003. Proceedings. 21st, 1.