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    An Iterative Heuristic for State Justification in Sequential Automatic Test Pattern Generation

    An Iterative Heuristic for State Justification in Sequential Automatic Test Pattern Generation. In: An Iterative Heuristic for State Justification in, Dhahran, Saudi Arabia.

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    Abstract

    • Motivation • Test Pattern Generation for Sequential Circuits • Genetic Algorithms (GA) • Problem Definition • The Proposed Approach • Experiments and Results • Contributions • Future Directions

    Item Type: Conference or Workshop Item (Other)
    Subjects: Computer
    Department: College of Computing and Mathematics > Computer Engineering
    Depositing User: AbdulRahman
    Date Deposited: 02 Mar 2008 06:06
    Last Modified: 01 Nov 2019 13:22
    URI: http://eprints.kfupm.edu.sa/id/eprint/181