ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-ACHIP TEST DATA COMPRESSION BASED ON EXTENDED FREQUENCY DIRECTED RUN-LENGTH CODES. The 6th Saudi Engineering Conference, KFUPM, Dhahran, December 2002.
This is the latest version of this item.
|
PDF
P145.pdf Download (256kB) | Preview |
Abstract
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of 0’s. In this work, we demonstrate that higher test data compression can be achieved based on encoding both runs of 0’s and 1’s. We propose an extension to the FDR code and demonstrate by experimental results its effectiveness in achieving higher compression ratio.
Item Type: | Article |
---|---|
Subjects: | Computer |
Department: | College of Computing and Mathematics > lndustrial and Systems Engineering |
Depositing User: | Users 4447 not found. |
Date Deposited: | 02 Jun 2008 11:21 |
Last Modified: | 01 Nov 2019 13:27 |
URI: | http://eprints.kfupm.edu.sa/id/eprint/1647 |
Available Versions of this Item
- ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-ACHIP TEST DATA COMPRESSION BASED ON EXTENDED FREQUENCY DIRECTED RUN-LENGTH CODES. (deposited 02 Jun 2008 11:21) [Currently Displayed]