(2004) A class-based clustering static compaction technique for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.

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Abstract

Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.

Item Type:	Article
Subjects:	Computer
Department:	College of Computing and Mathematics > Computer Engineering
Depositing User:	Mr. Admin Admin
Date Deposited:	24 Jun 2008 13:48
Last Modified:	01 Nov 2019 14:07
URI:	http://eprints.kfupm.edu.sa/id/eprint/14771