(2003) A static test compaction technique for combinational circuits based on independent fault clustering. Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International conference, 3.

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Abstract

Testing system-on-chip involves applying huge amounts of test data, which is stored in the tester memory and then transferred to the circuit under test during test application. Therefore, practical techniques, such as test compression and compaction, are required to reduce the amount of test data in order to reduce both the total testing time and the memory requirements for the tester. In this paper, a new static compaction algorithm for combinational circuits is presented. The algorithm is referred to as independent fault clustering. It is based on a new concept called test vector decomposition. Experimental results for benchmark circuits demonstrate the effectiveness of the new static compaction algorithm.

Item Type:	Article
Subjects:	Computer
Department:	College of Computing and Mathematics > Computer Engineering
Depositing User:	Mr. Admin Admin
Date Deposited:	24 Jun 2008 13:22
Last Modified:	01 Nov 2019 14:04
URI:	http://eprints.kfupm.edu.sa/id/eprint/14098