(2000) Using SPICE circuit simulation program in reliability analysis of redundant systems with non-repairable units and common-cause failures. Active and Passive Electronic Components, 22 (4). pp. 235-255.

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Abstract

The effectiveness of Simulation Program with Integrated Circuit Emphasis (SPICE) in calculating probabilities, reliability, steady-state availability and mean-time to failure of redundant systems with non-repairable units and common-cause failures described by Markov models is demonstrated. General equations and procedure for constructing the equivalent circuit for N parallel units are presented. Results obtained, for N = 1 ,2,3, using SPICE are compared with previously published results obtained using the Laplace transform method. Full SPICE listings are included.

Item Type:	Article
Subjects:	Electrical
Department:	College of Engineering and Physics > Electrical Engineering
Depositing User:	Obaid-Ur-Rehman Khattak
Date Deposited:	18 May 2008 07:42
Last Modified:	01 Nov 2019 13:26
URI:	http://eprints.kfupm.edu.sa/id/eprint/1323