Items where Author is "Khursheed, S. Saqib"
Group by: Item Type | No Grouping Jump to: Article | Conference or Workshop Item Number of items: 4.
ArticleEl-Maleh, Aiman H. and Khursheed, S. Saqib (2007) Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. IET Computers & Digital Techniques, 1 (4). pp. 364-368. El-Maleh, Aiman H. and Khursheed, S. Saqib (2006) Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. IEEE Int. Design and Test Workshop. El-Maleh, Aiman H. and Khursheed, S. Saqib and Sait, Sadiq M. (2006) Efficient static compaction techniques for sequential circuits based on reverse-order restoration and test relaxation. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS 25 (11): 2556-2564 NOV 2006. Conference or Workshop ItemEl-Maleh, Aiman H. and Khursheed, S. Saqib and Sait, Sadiq M. (2005) Efficient Static Compaction Techniques for Sequential Circuits based on Reverse Order Restoration Based and Test Relaxation. In: Proceedings of the 14th Asian Test Symposium (ATS ’05), Kolkata, India. |
