Items where Author is "Grinchuk, M."
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Al-Yamani, A. and Devta-Prasanna, N. and Chmelar, E. and Grinchuk, M. and Gunda, A. (UNSPECIFIED) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.