Items where Author is "Devta-Prasanna, N."
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 2.
Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A. (2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.
Al-Yamani, A. and Devta-Prasanna, N. and Chmelar, E. and Grinchuk, M. and Gunda, A. (UNSPECIFIED) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.