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Items where Author is "Devta-Prasanna, N."

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Article

Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A. (2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.

Al-Yamani, A. and Devta-Prasanna, N. and Chmelar, E. and Grinchuk, M. and Gunda, A. (UNSPECIFIED) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.

This list was generated on Sun Apr 20 13:57:04 2014 AST.