Items where Author is "Al-Yamani, A."
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 5.
Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A. (2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.
Al-Yamani, A. and Sait, Sadiq M. and Barada, H. and Youssef, H. (2003) Parallel tabu search in a heterogeneous environment. Parallel and Distributed Processing Symposium, 2003. Proceedings. International, 1.
Al-Yamani, A. and Sait, Sadiq M. and Barada, H.R. (2002) HPTS: heterogeneous parallel tabu search for VLSI placement. Evolutionary Computation, 2002. CEC '02. Proceedings of the 2002 Congress on, 1.
Suit, S.M. and Youssef, H. and Barada, H.R. and Al-Yamani, A. (2000) A parallel tabu search algorithm for VLSI standard-cell placement. Circuits and Systems, 2000. Proceedings. ISCAS 2000 Geneva. The 2000 IEEE International Symposium on, 2.
Al-Yamani, A. and Devta-Prasanna, N. and Chmelar, E. and Grinchuk, M. and Gunda, A. (UNSPECIFIED) Scan Test Cost and Power Reduction Through Systematic Scan Reconfiguration. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, 26.