Items where Author is "Al-Suwaiyan, Ali"
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ArticleEl-Maleh, Aiman H. and Al-Suwaiyan, Ali (2002) An Efficient Test Relaxation Technique for Combinational Circuits Based on Critical Path Tracing. 9th IEEE International Conference on Electronics, Circuits and Systems. pp. 461-465. El-Maleh, Aiman H. and Al-Suwaiyan, Ali (2002) An Efficient Test Relaxation Technique for Combinational & Full-Scan Sequential Circuits. 20’th IEEE VLSI Test Symposium. pp. 53-59. El-Maleh, Aiman and Al-Suwaiyan, Ali AN EFFICIENT TEST RELAXATION TECHNIQUE FOR COMBINATIONAL LOGIC CIRCUITS. The 6th Saudi Engineering Conference, KFUPM, Dhahran, December 2002. |
