Items where Author is "Al-Suwaiyan, A."
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ArticleEl-Maleh, A. and Al-Suwaiyan, A. (2002) An efficient test relaxation technique for combinational & full-scan sequential circuits. VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE, 1. El-Maleh, A. and Al-Suwaiyan, A. (2002) An efficient test relaxation technique for combinational circuits based on critical path tracing. Electronics, Circuits and Systems, 2002. 9th International conference, 2. |
