KFUPM ePrints

Items where Author is "Al-Suwaiyan, A."

Up a level
Export as [feed] RSS 2.0 [feed] RSS 1.0 [feed] Atom
Group by: Item Type | No Grouping
Jump to: Article
Number of items: 2.

Article

El-Maleh, A. and Al-Suwaiyan, A. (2002) An efficient test relaxation technique for combinational & full-scan sequential circuits. VLSI Test Symposium, 2002. (VTS 2002). Proceedings 20th IEEE, 1.

El-Maleh, A. and Al-Suwaiyan, A. (2002) An efficient test relaxation technique for combinational circuits based on critical path tracing. Electronics, Circuits and Systems, 2002. 9th International conference, 2.

This list was generated on Sat Oct 25 07:18:47 2014 AST.