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A Fault Independent Test Generation Method For Combinational Logic Circuits

Al-Deeb, Mohamed Mahdy (1992) A Fault Independent Test Generation Method For Combinational Logic Circuits. Masters thesis, KING FAHD UNIVERSITY OF PETROLEUM & MINERALS.

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Item Type:Thesis (Masters)
Date:June 1992
Date Type:Publication
Subjects:Computer
Divisions:College Of Computer Sciences and Engineering > Information and Computer Science Dept
Creators:Al-Deeb, Mohamed Mahdy
ID Code:1902
Deposited By:INVALID USER
Deposited On:08 Jun 2008 12:16
Last Modified:25 Apr 2011 08:22

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