El-Maleh, Aiman H. and Sait, Sadiq M. and Shazli, Syed Z. An Iterative Heuristic for State Justification in Sequential Automatic Test Pattern Generation. In: An Iterative Heuristic for State Justification in, Dhahran, Saudi Arabia.
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Abstract
• Motivation • Test Pattern Generation for Sequential Circuits • Genetic Algorithms (GA) • Problem Definition • The Proposed Approach • Experiments and Results • Contributions • Future Directions
| Item Type: | Conference or Workshop Item (Other) |
|---|---|
| Subjects: | Computer |
| Divisions: | College Of Computer Sciences and Engineering > Computer Engineering Dept |
| Creators: | El-Maleh, Aiman H. and Sait, Sadiq M. and Shazli, Syed Z. |
| Email: | aimane@kfupm.edu.sa, sadiq@kfupm.edu.sa, shazli@kfupm.edu.sa |
| ID Code: | 181 |
| Deposited By: | AbdulRahman |
| Deposited On: | 02 Mar 2008 09:06 |
| Last Modified: | 12 Apr 2011 13:07 |
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