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An Iterative Heuristic for State Justification in Sequential Automatic Test Pattern Generation

El-Maleh, Aiman H. and Sait, Sadiq M. and Shazli, Syed Z. An Iterative Heuristic for State Justification in Sequential Automatic Test Pattern Generation. In: An Iterative Heuristic for State Justification in, Dhahran, Saudi Arabia.

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Abstract

• Motivation • Test Pattern Generation for Sequential Circuits • Genetic Algorithms (GA) • Problem Definition • The Proposed Approach • Experiments and Results • Contributions • Future Directions



Item Type:Conference or Workshop Item (Other)
Subjects:Computer
Divisions:College Of Computer Sciences and Engineering > Computer Engineering Dept
Creators:El-Maleh, Aiman H. and Sait, Sadiq M. and Shazli, Syed Z.
Email:aimane@kfupm.edu.sa, sadiq@kfupm.edu.sa, shazli@kfupm.edu.sa
ID Code:181
Deposited By:AbdulRahman
Deposited On:02 Mar 2008 09:06
Last Modified:12 Apr 2011 13:07

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