El-Maleh, Aiman H. and Al-Abaji, Raslan H. ON IMPROVING THE EFFECTIVENESS OF SYSTEM-ON-ACHIP TEST DATA COMPRESSION BASED ON EXTENDED FREQUENCY DIRECTED RUN-LENGTH CODES. The 6th Saudi Engineering Conference, KFUPM, Dhahran, December 2002.
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One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of 0’s. In this work, we demonstrate that higher test data compression can be achieved based on encoding both runs of 0’s and 1’s. We propose an extension to the FDR code and demonstrate by experimental results its effectiveness in achieving higher compression ratio.
|Divisions:||College Of Computer Sciences and Engineering > Systems Engineering Dept|
|Creators:||El-Maleh, Aiman H. and Al-Abaji, Raslan H.|
|Deposited By:||INVALID USER|
|Deposited On:||02 Jun 2008 14:21|
|Last Modified:||12 Apr 2011 13:11|
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