El-Maleh, Aiman H. and Al-Abaji, Raslan H. (2002) Extended Frequency-Directed Run-Length Code with Improved Application to System-on-a-Chip Test Data Compression. 9th IEEE International Conference on Electronics, Circuits and Systems. pp. 449-452.
One of the major challenges in testing a System-on-a-Chip (SOC) is dealing with the large test data size. To reduce the volume of test data, several test data compression techniques have been proposed. Frequency-directed run-length (FDR) code is a variable-to-variable run length code based on encoding runs of 0’s. In this work, we demonstrate that higher test data compression can be achieved based on encoding both runs of 0’s and 1’s. We propose an extension to the FDR code and demonstrate by experimental results its effectiveness in achieving higher compression ratio.
|Divisions:||College Of Computer Sciences and Engineering > Computer Engineering Dept|
|Creators:||El-Maleh, Aiman H. and Al-Abaji, Raslan H.|
|Deposited By:||AIMAN HELMI EL-MALEH|
|Deposited On:||29 Feb 2008 22:55|
|Last Modified:||12 Apr 2011 13:06|
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