Al Zahir, Saif and El-Maleh, Aiman H. and Khan, Esam (2001) An Efficient Test Vector Compression Technique Based on Geometric Shapes. 8th IEEE International Conference on Electronics, Circuits and Systems. pp. 1561-1564.
One of the prime challenges of testing a system-on-a-chip (SOC) is to reduce the required test data size. In this paper, we introduce a novel compression / decompression scheme based on geometric shapes that substantially reduces the amount of test data and reduces test time. The proposed scheme is based on ordering the test vectors in such a way that enables the generation of geometric shapes that can be highly compressed via perfect lossless compression. Experimental results on ISCAS benchmark circuits demonstrate the effectiveness of the proposed technique in achieving very high compression ratio. Compared to published results, our technique achieves significantly higher compression ratio.
|Divisions:||College Of Computer Sciences and Engineering > Computer Engineering Dept|
|Creators:||Al Zahir, Saif and El-Maleh, Aiman H. and Khan, Esam|
|Email:||firstname.lastname@example.org, email@example.com, firstname.lastname@example.org|
|Deposited By:||AIMAN HELMI EL-MALEH|
|Deposited On:||28 Feb 2008 19:05|
|Last Modified:||12 Apr 2011 13:06|
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