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A class-based clustering static compaction technique for combinational circuits

El-Maleh, A.H. and Osais, Y.E. (2004) A class-based clustering static compaction technique for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.

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Abstract

Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.



Item Type:Article
Date:December 2004
Date Type:Publication
Subjects:Computer
Divisions:College Of Computer Sciences and Engineering > Computer Engineering Dept
Creators:El-Maleh, A.H. and Osais, Y.E.
ID Code:14771
Deposited By:KFUPM ePrints Admin
Deposited On:24 Jun 2008 16:48
Last Modified:12 Apr 2011 13:16

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