El-Maleh, A.H. and Osais, Y.E. (2004) A class-based clustering static compaction technique for combinational circuits. Microelectronics, 2004. ICM 2004 Proceedings. The 16th International conference, 1.
Static compaction based on test vector merging is a very simple and efficient technique. However, for a highly incompatible test set, merging achieves little reduction. In this paper, we propose a new static compaction technique in which a test vector is decomposed into its atomic components before it is processed. In this way, a test vector that is originally incompatible with all other test vectors in a given test set can be eliminated if its components can be merged with other test vectors.
|Divisions:||College Of Computer Sciences and Engineering > Computer Engineering Dept|
|Creators:||El-Maleh, A.H. and Osais, Y.E.|
|Deposited By:||KFUPM ePrints Admin|
|Deposited On:||24 Jun 2008 16:48|
|Last Modified:||12 Apr 2011 13:16|
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