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Generic DFT approach for pattern sensitive faults in word-orientedmemories

Amin, A.A. and Hamzah, A.A. and Abdel-Aal, R.E. (1996) Generic DFT approach for pattern sensitive faults in word-orientedmemories. Computers and Digital Techniques, IEE Proceedings -, 143.

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Abstract

The testability problem of word-oriented memories (WOMs) for pattern sensitive faults is addressed. A novel design for testability (DFT) strategy allows efficient built-in self-testing (BIST) of WOMs. By proper selection of the memory array tiling scheme, it is possible to implement O(n) BIST algorithms which test WOMs for various types of neighbourhood pattern sensitive faults (NPSFs). The inputs of the column decoders are modified to allow parallel writing into multiple words, and coincidence comparators are added to allow parallel verification of row data with minimal effect on chip area and performance



Item Type:Article
Date:May 1996
Date Type:Publication
Subjects:Computer
Divisions:College Of Engineering Sciences > Chemical Engineering Dept
Creators:Amin, A.A. and Hamzah, A.A. and Abdel-Aal, R.E.
ID Code:14484
Deposited By:KFUPM ePrints Admin
Deposited On:24 Jun 2008 16:37
Last Modified:12 Apr 2011 13:15

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