Al-Yamani, A.A. (2006) DFT for controlled-impedance I/O buffers. Design Automation Conference, 2006 43rd ACM/IEEE, 1.
This paper presents an architecture that enhances the testability of controlled-impedance buffers (CIBs). By testing CIBs digitally, the new architecture overcomes most of the problems with the traditional testing method. Most of these problems are test cost related. While reducing the test cost, the new architecture allows for higher test quality that even includes delay testing capabilities.
|Divisions:||College Of Computer Sciences and Engineering > Computer Engineering Dept|
|Deposited By:||KFUPM ePrints Admin|
|Deposited On:||24 Jun 2008 16:33|
|Last Modified:||12 Apr 2011 13:14|
Repository Staff Only: item control page