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DFT for controlled-impedance I/O buffers

Al-Yamani, A.A. (2006) DFT for controlled-impedance I/O buffers. Design Automation Conference, 2006 43rd ACM/IEEE, 1.

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This paper presents an architecture that enhances the testability of controlled-impedance buffers (CIBs). By testing CIBs digitally, the new architecture overcomes most of the problems with the traditional testing method. Most of these problems are test cost related. While reducing the test cost, the new architecture allows for higher test quality that even includes delay testing capabilities.

Item Type:Article
Date:July 2006
Date Type:Publication
Divisions:College Of Computer Sciences and Engineering > Computer Engineering Dept
Creators:Al-Yamani, A.A.
ID Code:14367
Deposited By:KFUPM ePrints Admin
Deposited On:24 Jun 2008 16:33
Last Modified:12 Apr 2011 13:14

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