KFUPM ePrints

Should Illinois-scan based architectures be centralized or distributed?

Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A. (2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.

[img]
Preview
PDF
17Kb
[img]Microsoft Word
26Kb

Abstract

This paper presents analysis of the trade off between hardware overhead, runtime, and test data volume when implementing systematic scan reconfiguration using centralized and distributed architectures of the segmented addressable scan, which is an Illinois-scan based architecture. The results show that the centralized scheme offers better data volume compression, similar ATPG runtime results and lower hardware overhead. The cost with the centralized scheme is in the routing congestion.



Item Type:Article
Date:October 2005
Date Type:Publication
Subjects:Computer
Divisions:College Of Computer Sciences and Engineering > Computer Engineering Dept
Creators:Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A.
ID Code:14288
Deposited By:KFUPM ePrints Admin
Deposited On:24 Jun 2008 16:30
Last Modified:12 Apr 2011 13:14

Repository Staff Only: item control page