Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A. (2005) Should Illinois-scan based architectures be centralized or distributed? Defect and Fault Tolerance in VLSI Systems, 2005. DFT 2005. 20th IEEE International Symposium on, 1.
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Abstract
This paper presents analysis of the trade off between hardware overhead, runtime, and test data volume when implementing systematic scan reconfiguration using centralized and distributed architectures of the segmented addressable scan, which is an Illinois-scan based architecture. The results show that the centralized scheme offers better data volume compression, similar ATPG runtime results and lower hardware overhead. The cost with the centralized scheme is in the routing congestion.
| Item Type: | Article |
|---|---|
| Date: | October 2005 |
| Date Type: | Publication |
| Subjects: | Computer |
| Divisions: | College Of Computer Sciences and Engineering > Computer Engineering Dept |
| Creators: | Al-Yamani, A. and Devta-Prasanna, N. and Gunda, A. |
| ID Code: | 14288 |
| Deposited By: | KFUPM ePrints Admin |
| Deposited On: | 24 Jun 2008 16:30 |
| Last Modified: | 12 Apr 2011 13:14 |
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