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Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials

Muqaibel, A. and Safaai-Jazi, A. and Riad, S. (2006) Fork-Coupled Resonators for High Frequency Characterization of Dielectric Substrate Materials. IEEE Transactions on Instrumentation and Measurements, 55 (6). pp. 2216-2220.

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Abstract

Abstract—Efficient coupling of energy in and out of a resonator can significantly enhance its performance, particularly when used for dielectric characterization of materials. In this paper, a new microstrip resonator is introduced, which uses fork-shaped feed elements for improving the coupling efficiency. The proposed resonator is studied both experimentally and theoretically with field simulation software. An important advantage of the fork microstrip resonator is attributed to its single-layer geometry and easier manufacturing processes. This resonator is used to characterize three different dielectric materials. Comparison of measurement results from the fork resonator with those obtained with a stripline resonator suggests that the proposed resonator offers a superior performance.



Item Type:Article
Date:December 2006
Date Type:Publication
Subjects:Electrical
Divisions:College Of Engineering Sciences > Electrical Engineering Dept
Creators:Muqaibel, A. and Safaai-Jazi, A. and Riad, S.
Email:muqaibel@kfupm.edu.sa, UNSPECIFIED, UNSPECIFIED
ID Code:1224
Deposited By:Obaid-Ur-Rehman Khattak
Deposited On:23 Apr 2008 09:06
Last Modified:12 Apr 2011 13:08

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